Materials Research Laboratory
CMM- Scanning Probe Microscopy
The scanning probe suite comprises six instruments with complementary capabilities that enable the measurment of sample topography down to atomic resolution, spectroscopy of local electronic structure
Atomic Force Microscopy (AFM)
AFMs are available for scanning in air, liquids or vacuum with a wide variety of imaging and measurement
modes, plus nanomanipulation and nanoindentation.
Scanning Tunneling Microscopy (STM)
An STM is equipped with a variable temperature (30 - 1200 K) stage for observations such as phase transitions,
surface reconstructions, and segregation as a function of temperature.