Staff Contact:
Scott MacLaren
(217) 244-2469 (office)
maclaren@illinois.edu
Digital Instruments / Veeco MultiMode AFM

The Digital Instruments / Veeco MultiMode AFM has a high-resolution, low noise
scanner for samples approximately one square cm or smaller. This system also features regular and low-current STM scanning,
and also has a nanoindenter from Hysitron for sample hardness measurements. This instrument has sub-angstrom vertical
resolution (lateral resolution is generally limited by the tip geometry, not the instrument).