MRL

Materials Research Laboratory

About    Directory    Contact Us    For Visitors    Search MRL    Text Only

CMM- Atomic Force Microscopy (AFM)

Staff Contact:

Scott MacLaren
(217) 244-2469 (office)
maclaren@illinois.edu

Digital Instruments / Veeco MultiMode AFM

The Digital Instruments / Veeco MultiMode AFM has a high-resolution, low noise scanner for samples approximately one square cm or smaller. This system also features regular and low-current STM scanning, and also has a nanoindenter from Hysitron for sample hardness measurements. This instrument has sub-angstrom vertical resolution (lateral resolution is generally limited by the tip geometry, not the instrument).