MRL

Materials Research Laboratory

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CMM- Atomic Force Microscopy (AFM)

Staff Contact:

Scott MacLaren
(217) 244-2469 (office)
maclaren@illinois.edu

Asylum Research MFP-3D AFMs

We have two advanced AFMs from Asylum Research. These are state-of-the-art systems featuring closed-loop, low noise, high precision scanners, with fluid cell, sample heater, Q-controlled AC modes (with phase imaging), conductive AFM, piezo response imaging, contact mode with lateral force, and detailed force-distance measurements. These systems allow scanning in air or liquid environments, and have extensive nanomanipulation and nanolithography capabilities.