Materials Research Laboratory
CMM- Transmission and Scanning Transmission Electron Microscopy (TEM and STEM)
Instrumentation for Transmission and Scanning Transmission Electron Microscopy:
TEM Instruments
Staff Contact:
Jim Mabon |
Wacek Swiech |
JEOL 2010LaB6 TEM
Location
0017 Materials Research Laboratory
General:
The 2010LaB6 is a conventional TEM. It is optimized for BF/DF imaging, diffraction and high
sample tilts. It operates at 200kV. The 2010LaB6 is equipped with a combined video rate/slow
scan camera for real time imaging and final image recording. A double tilt holder is available
with +/-45 degrees of tilt. Double tilt heating and liquid N2 stages are available.
Specifications:
- Cs = 1.4mm
- Energy 200kV
- Tilt 40 degrees on two axes
- Point resolution = 0.28nm
- Information Limit > 0.14nm
- Lens Type-Side entry (Condenser/Objective)
Attachments:
- Digital Imaging - Gatan MatScan1kx1k progressive scan CCD
- Computer Control - Digital Micrograph
- Free Lens Control
- 1000ºC double tilt holder
- Liquid N2 double tilt holder