Materials Research Laboratory

JEOL 2010F (S)TEM

Usage Rules
Links

General:
The 2010F is an energy filtering, field-emission analytic TEM/STEM. It is ideal for small probe work including: HAADF STEM, nanodiffraction, and spatially resolved EELS and EDS. It operates at 200kV and uses a Schottkey field emitter. The 2010F is equipped with an energy filter to filter both images and diffraction patterns as well as act as a energy-loss spectrometer. The system is capable of EDS/EELS mapping, holography, and in-situ heating and cooling. Both intensified video rate and slow-scan CCD cameras are available. The system is controlled by the JEOL FasTEM system allowing total computer control of the system.

Location
0026 Materials Research Laboratory

Specifications:

• Cs = 1.0mm Cc = 1.4mm
• Energy 200kV
• Tilt 40 degrees on one axis and 30 degrees on the other
• HAADF Resolution = 0.18nm
• HREM Point resolution = 0.24nm
• Information Limit > 0.12nm
• Lens Type-Side entry (Condenser/Objective)
• Energy Spread 0.7eV

Attachments:

• Image Filter - Gatan Image Filter (GIF) 2001
• EDS - Oxford INCA 30mm ATW detector
• Digital Imaging - 1k CCD on GIF
• Digital Scan - Gatan Digiscan and Oxford INCA
• Video - Intensified off-axis and GIF cameras
• Computer Control - FasTEM
• Biprism
• HAADF Detector
• 1000ºC double tilt holder
• Liquid N₂ double tilt holder

Links

• 2010F - FAQ
• CMM-Library (UIUC only)
• TEM Instructions
• Software Instructions
• JEOL Web Site
• Live Video