The CMM houses a suite of state-of-the-art instrumentation focussing on the micro- and nanocharacterization of materials using electron-beam, ion-beam, x-ray, and laser techniques. The CMM operates under the guidelines of the FSMRL Central Facilities philosophy that modern instrumentation for nanocharacterization of materials is most effectively utilized in a shared mode, supported by skilled professionals.

B70 MRL |
(217) 333-1383 |
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124 ESB |
(217) 333-1383 |
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Scanning Electron Microscopy (SEM) and Focussed Ion Beam (FIB) |
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0018 MRL |
(217) 244-4520 |
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B60 MRL |
(217) 244-5465 |
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0020 MRL |
(217) 333-4265 |
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0021 MRL |
(217) 333-4265 |
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0014 MRL |
(217) 244-2970 |
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0014 MRL |
(217) 244-2970 |
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0014 MRL |
(217) 244-2970 |
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0014 MRL |
(217) 244-2970 |
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B51 MRL |
(217) 244-2970 |
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0013 MRL |
(217) 244-4520 |
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B06 MRL |
(217) 244-2963 |
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B01 MRL |
(217) 244-2965 |
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B04 MRL |
(217) 244-2964 |
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B81 MRL |
(217) 244-2974 |
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B08 MRL |
(217) 244-2974 |
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B80 MRL |
(217) 333-0386 |
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Transmission and Scanning Transmission Electron Microscopy (TEM) and (STEM) |
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0026 MRL |
(217) 244-6116 |
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0011 MRL |
(217) 244-0620 |
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0017 MRL |
(217) 244-0620 |
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B60 MRL |
(217) 244-5465 |
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B58 MRL |
(217) 244-5465 |
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148 MRL |
(217) 265-6799 |
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148 MRL |
(217) 265-6799 |
|
148 MRL |
(217) 265-6799 |