Materials Research Laboratory
CMM- Conferences
As part of its outreach activities, the Center for Microanalysis of Materials and Frederick Seitz Materials Research Laboratory has hosted, and will continue to host, a variety of National/Regional conferences with topics of interest to the materials research community. Past conferences have had a strong emphasisis on the characterization of materials at the nanoscale.
Conferences
June 11-12, 2008 |
|
April 17, 2008 |
New Developments and Applications of TOF-SIMS, SAM, and XPS for Surface and Thin Film Analysis, Presented and Sponsored by Phyical Electronics |
June 19-22, 2007 |
|
May 23, 2007 |
|
Nov 14-15, 2005 |
|
June 9-10, 2005 |
MMMS05: Dynamics of Materials Revealed by Electron Microscopy |
June 23-24, 2003 |
|
June 3-6, 2003 |
Surface Analysis 2003- The 25th Annual Symposium |