| Surface Analysis 2003 Preliminary Program | |||
| 3-Jun-03 | Tuesday | ||
| Short Course- "Nucleation, Growth, and Microstructural Evolution," Joe Greene | |||
| Short Course- "X-ray Photoelectron Spectroscopy (XPS/ESCA)," John T. Grant | |||
| ASTM E-42 Meeting | |||
| 6:00 PM | 8:00 PM | Welcome Reception | |
| 8:00 PM | Close | ||
| 4-Jun-03 | Wednesday | ||
| Short Course- "Surface Characterization of Biomaterials," David G. Castner | |||
| Session Chair- Ivan Petrov | |||
| 8:30 AM | 8:40 AM | Intro and Welcome- Tai C. Chiang and Ivan Petrov | |
| 8:40 AM | 9:00 AM | Invited- "History of the Annual Symposium on Applied Surface Analysis," John T. Grant | |
| 9:00 AM | 9:40 AM | Invited- "Applications of NIST Databases for Surface Analysis by AES and XPS," Cedric Powell | |
| 9:40 AM | 10:20 AM | Invited (AVS Distinguished Lecturer)- "Ohmic Electrical Contacts to Compound Semiconductors," Paul H. Holloway | |
| 10:20 AM | 10:50 AM | Break/Posters-Group I /Vendor Exhibit | |
| Session Chair- Bruce Beard | |||
| 10:50 AM | 11:30 AM | Invited (AVS Distinguished Lecturer)- "The flexible surface - faceting induced by ultrathin films," Theodore E. Madey* | |
| 11:30 AM | 12:10 PM | Invited- "Scanning Probe Imaging and Spectroscopy: Tunneling, Forces and nanoscale Manipulation," Miquel Salmeron | |
| 12:10 PM | 1:20 PM | Lunch/Posters-Group I /Vendor Exhibit | |
| Session Chair- Paul H. Holloway | |||
| 1:20 PM | 1:40 PM | "Surface derivitization / XPS identification of surface oxygenated functionalities present on carbon black," Bruce Beard | |
| 1:40 PM | 2:20 PM | Invited (AVS Distinguished Lecturer)- "The Patterning and Etching of Silicon with Halogens: Atomic-Scale Characterization," J.H. Weaver, K.S. Nakayama, G.J. Xu, E. Graugnard, B.R. Trenhaile, and C.M. Aldao | |
| 2:20 PM | 3:00 PM | Invited- "Interfaces and Interphases – a Key to Understanding Nanostructured Hard Coatings," J. Patscheider, N. Hellgren, R. Haasch, R. Twesten, T. Zehnder, I. Petrov, and J. E. Greene | |
| 3:00 PM | 3:40 PM | Invited (AVS Distinguished Lecturer)- "Microstructural and Surface Morphological Evolution at the Atomic Scale during Sputter Deposition of TiN: a HR-TEM, XRD, STM, and Modeling Study," Joe Greene, S. Kodambaka, S.V. Khare, V. Petrova, and I. Petrov | |
| 3:40 PM | 5:10 PM | Formal Poster Session- Group I /Vendor Exhibits | |
| 5:10 PM | 6:30 PM | CMM Open House | |
| 6:30 PM | Close | ||
| 5-Jun-03 | Thursday | ||
| Short Course- "Sputter Deposition," Joe Greene | |||
| Session Chair- Rick Haasch | |||
| 8:30 AM | 9:10 AM | Invited- "Surface and Microanalysis in the Lab, and, now, the FAB," Charles A. Evans, Jr. | |
| 9:10 AM | 9:50 AM | Invited- "Secondary Ion Mass Spectrometry: The best, worst analytical technique," Peter Williams | |
| 9:50 AM | 10:20 AM | Break/Posters-Group II /Vendor Exhibit | |
| Session Chair- Cedric Powell | |||
| 10:20 AM | 10:40 AM | "Evaluation of a Gold LMIG for Detecting Small Molecules in a Polymer Matrix by TOF-SIMS," S.R. Bryan and A.M. Belu | |
| 10:40 AM | 11:00 AM | "Molecular Imaging Using Atomic and Molecular Primary Ions," Albert Schnieders, Felix Kollmer and Ewald Niehuis | |
| 11:00 AM | 11:20 AM | "Development and Practical Applications of a Low-Cost Automated Imaging SIMS Instrument," A.J. Eccles, N. J. Long, and T.A. Steele | |
| 11:20 AM | 11:40 AM | "Quantitative Chemical State XPS Imaging," C. Blomfield, S. Page, S. Hutton, and D. Surman | |
| 11:40 AM | 12:00 PM | "Non-destructive Analysis of Ultra-thin Dielectric Films," R. Champanaria, P. Mack, R. White and J. Wolstenholme | |
| 12:00 PM | 12:20 PM | "Advances in Chemical Imaging: NanoSAM and NanoESCA," Jörg Westermann, Georg Schäfer, Dietmar Funnemann, and Fred Henn | |
| 12:20 PM | 1:30 PM | Lunch/Posters-Group II /Vendor Exhibit | |
| Session Chair- John T. Grant | |||
| 1:30 PM | 2:10 PM | Invited- "Surface spectroscopy of nano-scale reactions in aqueous solution," K. H. Pecher* and B. P. Tonner | |
| 2:10 PM | 2:50 PM | Invited- "Quantitative analysis of surface nano-structures by XPS," Sven Tougaard | |
| 2:50 PM | 3:10 PM | "Testing The Capabilities Of Xps And Parxps For N Depth Distribution In Ultra-Thin (15a) Gate Oxynitrides," C. R. Brundle | |
| 3:10 PM | 3:30 PM | "Characterization of “Hyper-Thin” Oxynitride Gate Dielectrics Through XPS & Exit Wave Reconstruction HRTEM," E. L. Principe, D. G. Watson , and C. Kisielowski | |
| 3:30 PM | 3:50 PM | "Approaches to quantitative characterization of nonuniform films and coatings," Stephen W. Gaarenstroom | |
| 3:50 PM | 4:10 PM | "Carbide Analysis Accuracy of Using Auger Electron Spectroscopy," Joseph D. Geller | |
| 4:10 PM | 4:30 PM | "Measurements of Thermal Parameters and mechanical properties of Polymers by Atomic Force Microscopy," M. Meincken and R.D. Sanderson | |
| 4:30 PM | 6:00 PM | Formal Poster Session II /Vendor Exhibits | |
| 6:00 PM | Close | ||
| 6-Jun-03 | Friday | ||
| Short Course- "Sputter Deposition," Joe Greene | |||
| Session Chair- Joerg Patscheider | |||
| 8:30 AM | 9:10 AM | Invited- "Atomic scale fabrication and characterization on silicon surfaces," Joseph W. Lyding, Lequn Liu, Jixin Yu, Peter M. Albrecht, and Robert M. Farrell | |
| 9:10 AM | 9:50 AM | Invited- "Opportunities in Nanomagnetism," Samuel D. Bader | |
| 9:50 AM | 9:55 AM | Student Award Presentation | |
| 9:55 AM | 10:20 AM | Break/Vendor Exhibit | |
| Session Chair- | |||
| 10:20 AM | 11:00 AM | Invited- Ralph G. Nuzzo | |
| 11:00 AM | 11:40 AM | Invited- "Analyzing Organic Surfaces- From Biomaterials to Conducting Polymers," Luke Hanley | |
| 11:40 AM | 12:00 PM | "Quantitative Characterization of DNA Films by XPS," D. Y. Petrovykh, H. Kimura-Suda, M. J. Tarlov, and L. J. Whitman | |
| 12:00 PM | 12:30 PM | Invited- "Static SIMS Imaging of Liposomes and Cells," Sara G. Ostrowski, Thomas P. Roddy, Christopher W. Szakal, Nicholas Winograd, Andrew G. Ewing | |
| 12:30 PM | 1:30 PM | Lunch/Vendor Exhibit | |
| Session Chair- | |||
| 1:30 PM | 2:10 PM | Invited- "Interactions of energetic ions with surfaces," R.S. Averback | |
| 2:10 PM | 2:50 PM | Invited- "Surface X-ray Diffraction," Ian Robinson | |
| 2:50 PM | 3:30 PM | Invited- "Quantitative Electron Microscopy for Nanoscale Materials Characterization and Super-Resolution," Jian-Min (Jim) Zuo, J. Tao, Boquan Li and M. Gao | |
| 3:30 PM | 3:50 PM | "Sum Frequency Generation of Chemisorbed CO on a Pt(111)/Ru Electrode," G.-Q. Lu, J. White and A. Wieckowski | |
| 3:50 PM | 4:20 PM | Invited- "Watching Molecules Under Confinement," Ashis Mukhopadhyay and Steve Granick | |
| 4:20 PM | 4:40 PM | "Surface microtopography in equilibrium at elevated temperatures: step fluctuation spectroscopy with low-energy electron microscopy," M. Ondrejcek, W. Swiech, and C. P. Flynn | |
| 4:40 PM | Meeting Adjourns | ||