25th Annual Symposium on Applied Surface Analysis

June 3^rd-6^th, 2003

Center for Microanalysis of Materials
Frederick Seitz Materials Research Laboratory
University of Illinois at Urbana-Champaign

Cosponsored by: AVS Applied Surface Science Division,
AVS Prairie Chapter, College of Engineering - UIUC

Corporate sponsors and exhibitors:

Exhibitors

Vendor Exhibit - Sold Out

Preliminary Program Poster Session I Poster Session II The Conference will provide a forum for scientists in all disciplines to discuss advances in surface analysis techniques and their application to thin films, semiconductors, composites, ceramics, polymers, biomaterials, catalysts, tribology, adhesion, and other material systems. Topics of particular interest are imaging with high lateral resolution and applications of quantitative surface analysis. Attention will be given to these topics as they apply to techniques such as AES, XPS, SIMS, RBS, SPM, NRA, and sputter-depth profiling, as well as to emerging techniques. The symposium will consist of invited papers, contributed papers and posters, and an equipment exhibition. Invited Speakers || Call for Papers || Registration || Travel & Lodging Vendor Exhibition || Short Courses || Program Committee  For more information, comments and suggestions, please contact: Conference Email: sa03@mrl.uiuc.edu Surface Analysis'03 Center for Microanalysis of Materials 104 South Goodwin Avenue Urbana, IL 61801, USA fax: 217 244 2278, phone: 217 333 1370

This website and its contents © 2002 University of Illinois. All Rights Reserved.