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INVITED SPEAKERS
J. C. H. Spence
Department of Physics and
Astronomy
Arizona State University
Electron diffraction from a laser aligned beam of proteins
Frances Ross
IBM Research Division
Thomas J. Watson Research Center
Dynamic observation of nanostructure growth processes
John Balk
Department of Chemical and
Materials Engineering
University of Kentucky
New Insights into Thin
Film Plasticity by in situ Transmission Electron Microscopy
Marija Gajdardziska-Josifovska
Department of Physics
University of Wisconsin Milwaukee
Polar Oxide Surfaces
and Interfaces: Ex-situ and In-situ Electron Microscopy Studies
Yasuo Ito
Dept. of Physics,
Northern Illinois University
Sensing magnetic
anisotropy by momentum resolved EELS
Bernd Kabius
Argonne National Laboratory
Aberration correction and
prospects for in-situ TEM
Mark Kirk
Argonne National Laboratory
Diffuse electron scattering by
individual defects and dislocations in metals
Laurence Marks
Materials Science and
Engineering Department
Northwestern University
Oxide Surfaces:
Finding the Atoms then Finding the Electrons
Eva Olsson
Chalmers University, Sweden
Local Probing of Electron
Transport Properties and Structure Using TEM-STM
Ian Robertson
Dept. Materials Science
University of Illinois
Correlating
dislocation behavior with macroscopic mechanical properties
Renu Sharma
Center for Solid State Science
Arizona State University
Combining nanoscale synthesis and characterization
using environmental transmission electron microscope
Eric Stach
Xiaoli Tan
Department of Materials Science
and Engineering
Iowa State University Ames
In situ TEM study of the
electric field-induced phenomena in ferroelectric ceramics
Paul Voyles
University of Wisconsin
Department of Materials Science
and Engineering
Medium-Range Order in Amorphous
Metals
Judith Yang
Materials Science and Engineering Department
University of Pittsburgh
Surface Oxidation Kinetics
Jim Zuo
Dept. Materials Science
University of Illinois
Coherent Nanoarea Electron Diffraction and the Solution of Phase Problem
John Abelson
Dept. Materials Science
University of Illinois
Fluctuation Electron Microscopy of Crystalline
Nuclei in Amorphous Semiconductors
Robert Klie
Brookhaven National Laboratory
Atomic resolution EELS analysis of defects and
interfaces in functional oxide materials
Invited Speakers
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