The Transmission Electron Aberration-corrected Microscope (TEAM) Project
For the past several years, five DOE-supported electron beam microscopy efforts, located at Argonne National Laboratory, Brookhaven National Laboratory, Lawrence Berkeley National Laboratory, Oak Ridge National Laboratory, and Frederick Seitz Materials Research Laboratory have pursued the development of a next generation Transmission Electron Aberration-corrected Microscope (TEAM). The first TEAM workshop was held in July 2000 at Argonne National Laboratory (TEAM Report 2000.pdf) followed by a second workshop in July 2002 at Lawrence Berkeley National Laboratory (TEAM Report 2002.pdf).

The CMM letter soliciting collaborations to the in-situ science portion of the project.

The project was presented to the Office of Basic Energy Sciences in October 2002 and to an external review panel in February 2003. TEAM is guided by a scientific advisory committee.

3rd TEAM Workshop, August 8th, 2003, San Antonio, Texas


TEAM Workshops and Outreach


A first TEAM workshop was held in July 2000 at Argonne National Laboratory (TEAM Report 2000.pdf).


The second TEAM workshop took place in July 2002 at Lawrence Berkeley National Laboratory (TEAM Report 2002.pdf).


The third TEAM workshop was held at the annual meeting of the Microscopy Society of America in San Antonio, August 8, 2003 (TEAM Report 2003.pdf).


Following the TEAM workshops in 2000, 2002 and 2003 a Focused Interest Group on “Materials Research in an Aberration-Free Environment” was founded within the Microscopy Society of America.


2004 TEAM Workshop + Focused Interest Group
A Focused Interest Group workshop was held immediately preceding the annual MSA meeting in Savannah. This meeting attracted ~150 participants and covered a broad range of issues in two half-day sessions. The meeting documented the significant interest in this subject within the microscopy community (FIG Savannah 2004.pdf).


2005 TEAM Workshop + Focused Interest Group
Following the success of the premeeting congress under the Focused Interest Group format, a second focused interest group on materials characterization in an aberration-free environment was held at the annual MSA meeting in Honolulu. This meeting was incorporated as a symposium under the regular meeting program. Over a two-day period, scientists from 9 different countries presented 32 contributions to an audience varying between 100 – 300 participants. The symposium stimulated a comparison of STEM and TEM performance, gave application examples, and provided an update on progress that was made in terms of instrumentation by manufacturers FEI, JEOL, Nion, and Zeiss (FIG Honolulu 2005.pdf).


2005 In-situ TEAM Workshop
A regional workshop on Dynamics of Materials Revealed by Electron Microscopy was held at the Seitz Materials Research Laboratory, University of Illinois in June 2005. The meeting was held under the auspices of the Midwest Microscopy and Microanalysis Society and focused on needs and opportunities for in-situ microscopy in the context of instrument development under TEAM (In-situ TEAM 2005.pdf).